PARADIM Highlights

High-Resolution Electron Microscopy gets Cooler

Today, sub-angstrom resolution scanning trans-mission electron microscopy (STEM) imaging is routinely achieved. In addition to resolving individual atomic columns in crystals, STEM performed at room temperature can be used to determine their positions with picometer precision which allows us to directly map local properties.


The Highest Resolution Microscope, enabled by a new detector technology, reaches an ultimate resolution limit – the vibrations of atoms themselves

By combining PARADIM’s new design of electron microscope pixel array detector (EMPAD), which has the dynamic range to record the complete distribution of transmitted electrons at every beam position and a phase retrieval algorithm to process the data, the research team has increased the spatial resolution well beyond the traditional lens limitations, setting a world record in 2018 for the highest resolution microscope.


Theory + MBE + ARPES to navigate correlated materials

PARADIM’s in-house research team is exploiting the world-leading tools of its Platform to provide a new modality of materials discovery for artificial quantum materials. This occurs through the unique combination of thin film growth with in-situ spectroscopy enabling scientists to directly see the impact of changes in structure on how the electrons move in these materials.


National Science Foundation

Division of Materials Research

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Alexandria, VA 22314

Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.