Nion UltraSTEM

Instrumentation


NION UltraSTEM 100
 
  • Cold field emission gun (CFEG)
  • Cs probe aberration correction
  • Sub-Angstrom-scale probe with 0.1 nA of current enables imaging with sub-angstrom (<0.1 nm) resolution
  • Electron optics can be changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes
  • Optimized for high-spatial and spectral resolution EELS
  • High-stability stage enables atomic-resolution EELS mapping over large length scales
 
The SuperSTEM has a spherical aberration corrector integrated into its column, which nulls all axial aberrations up to fifth order. As a result, an angstrom-scale probe with 0.1 nA of current enables imaging with angstrom-level (0.1 nm) resolution. The electron optics can be quickly changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes (electron energy loss spectroscopy). Samples can be automatically oriented to a given axis.
CONTACT:

National Science Foundation

Division of Materials Research

2415 Eisenhower Avenue

Alexandria, VA 22314

Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
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