EMPAD Detector

Instrumentation | Electron Microscopy

High-speed, high-dynamic range momentum-resolved electron microscope pixel-array detector developed by Muller and collaborators; Quantitative metrology of structure and physical properties at the atomic scale; Picometer-precision measurements of lattice constants; Quantitative characterization of strain, crystal orientation, local polarity; Measurements of electric and magnetic fields; Ptychography enables 2.5-fold improvement in resolution over current state of the art methods;

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National Science Foundation

Division of Materials Research

2415 Eisenhower Avenue

Alexandria, VA 22314

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