EMPAD Detector

Instrumentation | Electron Microscopy

High-speed, high-dynamic range momentum-resolved electron microscope pixel-array detector developed by Muller and collaborators; Quantitative metrology of structure and physical properties at the atomic scale; Picometer-precision measurements of lattice constants; Quantitative characterization of strain, crystal orientation, local polarity; Measurements of electric and magnetic fields; Ptychography enables 2.5-fold improvement in resolution over current state of the art methods;

Learn more.
CONTACT:

National Science Foundation

Division of Materials Research

2415 Eisenhower Avenue

Alexandria, VA 22314

Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
SOCIAL: