The nanoprobe STM features 4 independent tips that can be used for 4-point in-situ electrical transport measurements down to 4.5 K. The integrated scanning electron microscope (SEM) can be used to position each tip independently over chosen features of the sample with a resolution better than 1 micron. Each tip is capable of scanning tunneling measurements although currently only one tip can be used for STM at a time. A small superconducting coil under the sample stage can produce magnetic fields up to 200 gauss. Argon sputtering is available for tip and sample cleaning and preparation.