The cryogenic ARPES module features a high intensity helium plasma source and monochromator, allowing energy- and momentum-resolved electronic structure characterization of thin films and single crystals with He 1 (21.22 eV, 23.08 eV), or He 2 (41.81 eV) photon excitation down to a sample temperature below 20 K. The DA-30L spherical analyzer can resolve down to 1.8 meV using a 2 eV pass energy. In addition to the helium light source, the ARPES module is also equipped with a tunable-wavelength Y-Fi laser light source with four excitation energies in the range of 7.2-10.8 eV.