The Epsilon 1™ XRF from Malvern Panalytical™ is designed to provide elemental composition analysis of trace (ppm to ppb), major, and minor elements from sodium to americium. The instrument is not able to quantify elements lighter than sodium. More quantitative than the energy dispersive x-ray spectrometers (EDS) typically attached to many electron microscopes, the XRF measures samples under ambient conditions, so it can analyze both liquid and solid samples, powders, and samples contained in plastic or glass containers. Sample compartment is also substantially larger than standard SEM chambers, and so the instrument can accommodate larger samples.  No calibrations are required with Omnium Factory Calibration method.