Phenom G6 Pro SEM from nanoScience Instruments™ (Thermo Fisher™) with a cesium hexaboride source. Situated between confocal optical microscopy and these high-end electron microscopes in terms of resolution, the instrument provides a user-friendly entry point for persons not familiar with electron microscopy.  Back-scattered detection (BSD), secondary electron detection (SED), or mixed detection are available. Magnification range of 160-350,000x. A single-stub stage supports sample sizes up to 25mm x 35 mm. Sample introduction is very rapid: 18 seconds between initial pump-down and image acquisition. A sample charging reduction stage is available (BSD mode) for samples that cannot be sputter coated.  A Luxor Sputter Coater is also available, for inverted coating (argon atmosphere) of up to 7 sample stubs with platinum layers of thickness 1-100nm to reduce charging in the electron beam.