Room temperature S/TEM imaging and analysis including differential phase contrast (DPC), bright field, dark field and high-angle annular dark field imaging, electron diffraction, highly sensitive 4-detector Super-X EDS for quantitative elemental analysis and mapping.

• X-FEG high brightness electron source (1.8x109 A/cm2srad @200 kV) with 0.12 nm (TEM), 0.16 nm (STEM) information limit.

• Flexible high tension range from 60 to 200 kV.

• Constant power A-TWIN objective lens for thermal stability and easy mode switching.

• Industry-leading high-speed, high-throughput, windowless 4-detector, Super-X energy dispersive X-ray spectroscopy (EDS) signal detection.

• Differential phase contrast (DPC) imaging for electromagnetic studies.

• Automatic apertures and reproducible recall.

• Rotation-free imaging for clear orientation.