The Icon3® atomic force microscope (AFM) introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry; high performance, multifunctional, scanning probe microscope (SPM) optimized for peak force characterization.  Housed within an integrated acoustic and vibration isolation enclosure to ensure optimal data collection. Motorized stage with a typical X-Y scan range of 90µm x 90µm.  Various advanced operation modes including: PeakForce Tapping/contacting, Force spectroscopy, Surface potential, Piezoresponse microscopy, Tunneling AFM, etc.