Testing Modes

• 1D Standard Nanoindentation

• XPM -  Accelerated Property Mapping

• nanoDMA III Dynamic Nanoindentation

• In-situ SPM Imaging

Sample Requirements/Specifications

• 1D normal force and 1D nanoDMA transducer assemblies

• Samples must be smooth on both front and backside.  Backside polish only needs to be good enough to hold vacuum or glued to metal disk for mounting on stage.

• Sample must be flat (less than 1 degree of tilt when loaded on stage)

• Sample Size: less than 10cm laterally, less than 4cm tall

• Sample roughness will depend on indentation depth, less than 50nm is required

• Maximum force is 10mN, maximum Displacement in Z is 4µm