Capabilities:

• Fast scanning, large-sample AFM

• Tapping Mode (AC Mode) and Contact Mode

• Raster rates as high as ~20 Hz (~5Hz typical for high resolution scans of atomically flat 2D films)

• Simi-automated Ergo control software

• Optimized for wafer scale analysis of thin films

• 100 um x 100 um maximum X-Y lateral scan window

• 12 um maximum Z-range

• Fully motorized laser and detector setup 

• Fully addressable, high-speed stage can access any point on samples up 200 mm in diameter