AFM: Bruker Icon II
Capabilitities
- Contact Mode, Lateral Force Microscopy 
- Piezo Response Microscopy 
- Conductive AFM, Scanning Capacitance Microscopy 
- Tapping Mode w/ Phase Imaging 
- Electrostatic Force Microscopy, Magnetic Force Microscopy,Kelvin Probe Force Microscopy 
- PeakForce Tapping w/ ScanAsyst 
- PeakForce Quantitative Nanomechanical Mapping 
- PeakForce TUNA • PeakForce Kelvin Probe Force Microscopy 
- Dimension heater/cooler stage enables AFM at two different temperature ranges: - -35ºC up to 100ºC 
- room temperature up to 250ºC 
 
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