AFM: Bruker Icon II
Capabilitities
Contact Mode, Lateral Force Microscopy
Piezo Response Microscopy
Conductive AFM, Scanning Capacitance Microscopy
Tapping Mode w/ Phase Imaging
Electrostatic Force Microscopy, Magnetic Force Microscopy,Kelvin Probe Force Microscopy
PeakForce Tapping w/ ScanAsyst
PeakForce Quantitative Nanomechanical Mapping
PeakForce TUNA • PeakForce Kelvin Probe Force Microscopy
Dimension heater/cooler stage enables AFM at two different temperature ranges:
-35ºC up to 100ºC
room temperature up to 250ºC
Universities