Characterization in Three Dimensions

X-ray microtomography, like tomography and X-ray computed tomography, uses X-rays to create cross-sections of a physical object that can be used to recreate a virtual model (3D model) without destroying the original object. Through instrument cross-sharing agreements, PARADIM users can utilize the modern Bruker SkyScan 1172 to determine the microstructure of grown materials in three dimensions. This has been found to be particularly useful in identifying grain nucleation and growth patterns to speed optimization of synthetic conditions.

In addition to the micro-CT scan capability, PARADIM also has direct access to a scanning electron microscope (SEM) for analysis of the grown crystals. The SEM also provides energy dispersive spectroscopy which can be used for elemental analysis and mapping.

-Bruker SkyScan 1172
-Scanning Electron Microscope (SEM)

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