Rapid structural characterization of epitaxial thin films is available on-site with a Panalytical Empyrean four circle X-ray diffractometer (XRD), offering high-intensity θ-2θ scans, rocking curves, and a 2-D pixel detector for reciprocal space maps (RSMs).  XRD provides critical feedback of phase purity, film thickness, and structural information to aid in optimizing thin film growth parameters in the MBE

Example XRD Data: Ruf, J.P., Paik, H., Schreiber, N.J. et al. Strain-stabilized superconductivity. Nat Commun12, 59 (2021). https://doi.org/10.1038/s41467-020-20252-7

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