Rapid structural characterization of epitaxial thin films is available on-site with a Panalytical Empyrean four circle X-ray diffractometer (XRD), offering high-intensity θ-2θ scans, rocking curves, and a 2-D pixel detector for reciprocal space maps (RSMs). XRD provides critical feedback of phase purity, film thickness, and structural information to aid in optimizing thin film growth parameters in the MBE