Today, sub-angstrom resolution scanning trans-mission electron microscopy (STEM) imaging is routinely achieved. In addition to resolving individual atomic columns in crystals, STEM performed at room temperature can be used to determine their positions with picometer precision which allows us to directly map local properties.
By combining PARADIM’s new design of electron microscope pixel array detector (EMPAD), which has the dynamic range to record the complete distribution of transmitted electrons at every beam position and a phase retrieval algorithm to process the data, the research team has increased the spatial resolution well beyond the traditional lens limitations, setting a world record in 2018 for the highest resolution microscope.
PARADIM’s in-house research team is exploiting the world-leading tools of its Platform to provide a new modality of materials discovery for artificial quantum materials. This occurs through the unique combination of thin film growth with in-situ spectroscopy enabling scientists to directly see the impact of changes in structure on how the electrons move in these materials.
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National Science Foundation
Division of Materials Research
2415 Eisenhower Avenue
Alexandria, VA 22314